This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Optics of Charged Particle Analyzers
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This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
- ISBN:
- 9780123813145
- 9780123813145
- Category:
- Imaging systems & technology
- Format:
- Hardback
- Publication Date:
- 26-07-2010
- Language:
- English
- Publisher:
- Elsevier Science Publishing Co Inc
- Country of origin:
- United States
- Edition:
- 163rd Edition
- Pages:
- 248
- Dimensions (mm):
- 229x152x18mm
- Weight:
- 0.46kg
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