This book describes the technology of charge-trapping non-volatile memories and their uses. The authors explain the device physics of each device architecture and provide a concrete description of the materials involved and the fundamental properties of the technology. Modern material properties, used as charge-trapping layers, for new applications are introduced.
Provides a comprehensive overview of the technology for charge-trapping non-volatile memories;
Details new architectures and current modeling concepts for non-volatile memory devices;
Focuses on conduction through multi-layer gate dielectrics stacks.
- ISBN:
- 9783319487038
- 9783319487038
-
Category:
- Circuits & components
- Format:
- Hardback
- Publication Date:
-
28-02-2017
- Publisher:
- Springer International Publishing AG
- Country of origin:
- Switzerland
- Pages:
- 211
- Dimensions (mm):
- 235x155x14mm
- Weight:
- 4.56kg
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