Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior.
- ISBN:
- 9789048196432
- 9789048196432
-
Category:
- Circuits & components
- Format:
- Hardback
- Publication Date:
-
21-09-2012
- Language:
- English
- Publisher:
- Springer
- Country of origin:
- Netherlands
- Pages:
- 124
- Dimensions (mm):
- 235x155x9mm
- Weight:
- 3.32kg
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