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Digital Integrated Circuit Testing from a Quality Perspective

Digital Integrated Circuit Testing from a Quality Perspective

by Eugene R. Hnatek
Hardback
Publication Date: 31/08/1993

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Applies the methods of modern quality to the testing of digital integrated circuits. Explains new paradigms and techniques ranging from SSI to high-level VLSI, and how to match testing methods to the design and physical layout of the device. Accounts for the change in the electronics industry from a
ISBN:
9780442006433
9780442006433
Category:
Circuits & components
Format:
Hardback
Publication Date:
31-08-1993
Language:
English
Publisher:
Van Nostrand Reinhold Inc.,U.S.
Country of origin:
United States
Pages:
180
Dimensions (mm):
234x156x12mm
Weight:
1kg

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