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High-Level Estimation and Exploration of Reliability for Multi-Processor System-On-Chip

High-Level Estimation and Exploration of Reliability for Multi-Processor System-On-Chip

by Anupam Chattopadhyay and Zheng Wang
Hardback
Publication Date: 28/07/2017
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Introduction.- Background.- Related Work.- High-level Fault Injection and Simulation.- Architectural Reliability Estimation.- Architectural Reliability Exploration.- System-level Reliability Exploration.- Conclusion and Outlook.
ISBN:
9789811010729
9789811010729
Category:
Circuits & components
Format:
Hardback
Publication Date:
28-07-2017
Language:
English
Publisher:
Springer
Country of origin:
United States
Dimensions (mm):
235x155mm
Weight:
4.56kg

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You can find this item in:

Circuits & components Engineering: general Parallel processing Computer hardware Systems analysis & design Computer science
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