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Nanometrology Using the Transmission Electron Microscope

Nanometrology Using the Transmission Electron Microscope

by Vlad Stolojan
Paperback
Publication Date: 30/10/2015

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The Transmission Electron Microscope (TEM) is the ultimate tool to see and measure structures on the nanoscale and to probe their elemental composition and electronic structure with sub-nanometer spatial resolution. Recent technological breakthroughs have revolutionized our understanding of materials via use of the TEM, and it promises to become a significant tool in understanding biological and biomolecular systems such as viruses and DNA molecules. This book is a practical guide for scientists who need to use the TEM as a tool to answer questions about physical and chemical phenomena on the nanoscale.
ISBN:
9781681740560
9781681740560
Category:
Engineering measurement & calibration
Format:
Paperback
Publication Date:
30-10-2015
Publisher:
Morgan & Claypool Publishers
Country of origin:
United States
Pages:
68
Dimensions (mm):
254x178x4mm
Weight:
0.33kg

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