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New Horizons of Applied Scanning Electron Microscopy

New Horizons of Applied Scanning Electron Microscopy

by Kenichi Shimizu and Tomoaki Mitani
Paperback
Publication Date: 04/05/2012

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In modern scanning electron microscopy, sample surface preparation is of key importance, just as it is in transmission electron microscopy. With the procedures for sample surface preparation provided in the present book, the enormous potential of advanced scanning electron microscopes can be realized fully. This will take the reader to an entirely new level of scanning electron microscopy and finely-detailed images never seen before.
ISBN:
9783642261688
9783642261688
Category:
Microscopy
Format:
Paperback
Publication Date:
04-05-2012
Language:
English
Publisher:
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Country of origin:
Germany
Pages:
182
Dimensions (mm):
235x155x13mm
Weight:
0.31kg

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