This work covers important aspects of X-ray spectrometry, from basic principles to the selection of instrument parameters and sample preparation. This edition explicates the use of combined X-ray fluorescence and X-ray diffraction data, and features new applications in environmental studies, forensic science, archeometry and the analysis of metals and alloys, minerals and ore, ceramic materials, catalysts and trace metals.;This work is intended for spectroscopists, analytical chemists, materials scientists, experimental physicists, mineralogists, biologists, geologists and graduate-level students in these disciplines.
- ISBN:
- 9780824795542
- 9780824795542
-
Category:
- Spectrum analysis
- Format:
- Hardback
- Publication Date:
-
26-04-1995
- Language:
- English
- Publisher:
- Taylor & Francis Inc
- Country of origin:
- United States
- Edition:
- 2nd Edition
- Pages:
- 504
- Dimensions (mm):
- 234x156x29mm
- Weight:
- 0.84kg
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