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VLSI Design and Test

VLSI Design and Test

26th International Symposium, VDAT 2022, Jammu, India, July 17-19, 2022, Revised Selected Papers

by Ambika Prasad ShahSudeb Dasgupta Anand Darji and others
Paperback
Publication Date: 17/01/2023

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This book constitutes the proceedings of the 26th International Symposium on VLSI Design and Test, VDAT 2022, which took place in Jammu, India, in July 2022.
The 32 regular papers and 16 short papers presented in this volume were carefully reviewed and selected from 220 submissions. They were organized in topical sections as follows: Devices and Technology; Sensors; Analog/Mixed Signal; Digital Design; Emerging Technologies and Memory; System Design.
ISBN:
9783031215131
9783031215131
Category:
Computer hardware
Format:
Paperback
Publication Date:
17-01-2023
Publisher:
Springer International Publishing AG
Country of origin:
Switzerland
Pages:
596
Dimensions (mm):
235x155mm
Weight:
0.93kg

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