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VLSI Design and Test

VLSI Design and Test

22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers

by S. RajaramN. B. Balamurugan D. Gracia Nirmala Rani and others
Paperback
Publication Date: 18/03/2019

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Digital design.- Analog and mixed signal design.- Hardware security.- Micro bio-fluidics.- VLSI testing.- Analog circuits and devices.- Network-on-chip.- Memory.- Quantum computing and NoC.- Sensors and interfaces.
ISBN:
9789811359491
9789811359491
Category:
Computer hardware
Format:
Paperback
Publication Date:
18-03-2019
Language:
English
Publisher:
Springer
Country of origin:
United States
Dimensions (mm):
235x155mm
Weight:
1.12kg

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