Advances in Imaging and Electron Physics, Volume 224 highlights new advances in the field, with this new volume presenting interesting chapters on Measuring elastic deformation and orientation gradients by scanning electron microscopy - conventional, new and emerging methods, Development of an alternative global method with high angular resolution, Implementing the new global method, Numerical validation of the method and influence of optical distortions, and Applications of the method.

• Provides the authority and expertise of leading contributors from an international board of authors


• Presents the latest release in the Advances in Imaging and Electron Physics series


• Updated release includes the latest information on Measuring elastic deformation and orientation gradients by scanning electron microscopy - conventional, new and emerging methods