Advances in Optics of Charged Particle Analyzers: Part Two, Volume 233 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The release in the series features articles on Electrostatic Energy, Mass Analyzers With Combined Electrostatic and Magnetic Fields, Mass Analyzers based on Fourier Transform, Principles of Time-of-Flight Mass Analyzers, Multi-Pass Time-of-Flight Mass Analyzers, and Radiofrequency Mass Analyzers. - Provides the authority and expertise of leading contributors from an international board of authors - Presents the latest release in the Advances in Imaging and Electron Physics series - Features articles on Electrostatic Energy, Mass Analyzers With Combined Electrostatic and Magnetic Fields, and more