This book deals with the quantitative (mensural) aspects of Electron Micrography (EM) [obtained by using both, Transmission (TEM) and Scanning (SEM) types] by applying Photogrammetric techniques. Starting with the fundamentals of both, TEM and SEM, it discusses at length the applicable Photogrammetric aspects, viz., instruments, coordinate systems, scale considerations, projective geometries, distortions, refinements of photo coordinates and self-calibration in EM systems. By combining data from both, TEM and SEM, procedures of extracting the best possible information are explored and discussed. Digital three-dimensional (3-D) data processing and displaying procedures are discussed at length. People using the EM technologies desirous of mensural information in fields like microbiology, virology, microelectronics, metallurgy and criminology will find the book very useful.