Paperback
Publication Date: 13/12/2002
Explains the theoretical and experimental foundations of the measurement of the electrical properties of the MOS system and the technology for controlling its properties. Emphasizes the silica and the silica-silicon interface. Provides a critical assessment of the literature, corrects incomplete or incorrect theoretical formulations, and gives critical comparisons of measurement methods. Contains information needed to grow an oxide, make an MOS capacitor array, and fabricate an integrated circuit with optimal performance and stability.
- ISBN:
- 9780471430797
- 9780471430797
- Category:
- Semi-conductors & super-conductors
- Format:
- Paperback
- Publication Date:
- 13-12-2002
- Language:
- English
- Publisher:
- John Wiley & Sons Inc
- Country of origin:
- United States
- Pages:
- 928
- Dimensions (mm):
- 238x158x45mm
- Weight:
- 1.27kg
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You can find this item in:
Condensed matter physics (liquid state & solid state physics)
Physics
Semi-conductors & super-conductors
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