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2014 IEEE International Integrated Reliability Workshop Final Report (IIRW)

2014 IEEE International Integrated Reliability Workshop Final Report (IIRW)

by IEEE Staff
Spiral bound
Publication Date: 12/10/2014

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The IIRW focuses on ensuring electronic device reliability through fabrication, design, testing, characterization, and simulation, as well as identification of the defects and physical mechanisms responsible for reliability problems
ISBN:
9781479973088
9781479973088
Category:
Circuits & components
Format:
Spiral bound
Publication Date:
12-10-2014
Publisher:
IEEE
Country of origin:
United States

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