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Infrared Characterization For Microelectronics

Infrared Characterization For Microelectronics

by Wai Shing Lau
Hardback
Publication Date: 04/10/1999

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$77.95
The focus of this text is on practical applications useful to the production line and to the research and development of microelectronics. The background knowledge and significance of doing a particular type of infrared measurement is discussed in detail. The principal purpose of the book is to serve as a useful handbook for practising engineers and scientists in the field of microelectronics.
ISBN:
9789810223526
9789810223526
Category:
Non-destructive testing
Format:
Hardback
Publication Date:
04-10-1999
Publisher:
World Scientific Publishing Co Pte Ltd
Country of origin:
Singapore
Pages:
172
Dimensions (mm):
220x155x15mm
Weight:
0.36kg

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